The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application

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dc.contributor.authorOzaydin, C.
dc.contributor.authorGullu, O.
dc.contributor.authorPakma, O.
dc.contributor.authorIlhan, S.
dc.contributor.authorAkkilic, K.
dc.date.accessioned2024-04-24T16:15:26Z
dc.date.available2024-04-24T16:15:26Z
dc.date.issued2016
dc.departmentDicle Üniversitesien_US
dc.description.abstractIn this work, organometallic complex (OMC) films have been deposited onto glass or silicon substrates by spin coating technique and their photovoltaic application potential has been investigated. Optical properties and thickness of the film have been investigated by spectroscopic ellipsometry (SE). Also, transmittance spectrum has been taken by UV/vis spectrophotometer. The optical method has been used to determine the band gap value of the films. Also, Au/OMC/n-Si metal/interlayer/semiconductor (MIS) diode has been fabricated. Current voltage and photovoltaic properties of the structure were investigated. The ideality factor (n) and barrier height (Phi(b)) values of the diode were found to be 2.89 and 0.79 eV, respectively. The device shows photovoltaic behavior with a maximum open-circuit' voltage of 396 mV and a short circuit current of 33.8 mu A under 300W light. (C) 2016 Elsevier Ltd. All rights reserved.en_US
dc.description.sponsorshipRepublic of Turkey-Prime Ministry State Planning organization (DPT) [2010K120610]en_US
dc.description.sponsorshipThis study is supported by Republic of Turkey-Prime Ministry State Planning organization (DPT) (Project Number: 2010K120610, Batman University Central Research Laboratory).en_US
dc.identifier.doi10.1016/j.materresbull.2016.01.021
dc.identifier.endpage121en_US
dc.identifier.issn0025-5408
dc.identifier.issn1873-4227
dc.identifier.scopus2-s2.0-84955244746
dc.identifier.scopusqualityQ1
dc.identifier.startpage115en_US
dc.identifier.urihttps://doi.org/10.1016/j.materresbull.2016.01.021
dc.identifier.urihttps://hdl.handle.net/11468/15801
dc.identifier.volume77en_US
dc.identifier.wosWOS:000374360700017
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherPergamon-Elsevier Science Ltden_US
dc.relation.ispartofMaterials Research Bulletin
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectronic Materialsen_US
dc.subjectOrganic Compoundsen_US
dc.subjectSol-Gel Chemistryen_US
dc.subjectElectron Microscopyen_US
dc.subjectElectrical Propertiesen_US
dc.subjectElectronic Structureen_US
dc.titleThe optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode applicationen_US
dc.titleThe optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application
dc.typeArticleen_US

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