The influence of substrate temperature on RF sputtered CdS thin films and CdS/p-Si heterojunctions

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dc.contributor.authorBozkaplan, Cihat
dc.contributor.authorTombak, Ahmet
dc.contributor.authorGenisel, Mustafa Fatih
dc.contributor.authorOcak, Yusuf Selim
dc.contributor.authorAkkilic, Kemal
dc.date.accessioned2024-04-24T16:15:42Z
dc.date.available2024-04-24T16:15:42Z
dc.date.issued2017
dc.departmentDicle Üniversitesien_US
dc.description.abstractCadmium sulfide (CdS) thin films were deposited onto soda lime glasses and p-Si semiconductors at various substrate temperatures (40, 150 and 275 degrees C) by radio frequency (RF) sputtering technique. The effect of substrate temperature on morphological, structural and optical properties of CdS thin films were analyzed by means of atomic force microscopy (AFM), x-ray diffraction (XRD) and uv-vis spectrum data. The results showed that the average roughness (R-a) of thin films increased from 2.0 to 4.0 nm and all films had hexagonal wurtzite structure. The optical band gaps of CdS thin films varied between 2.46-2.43 eV. Characteristic parameters of CdS/p-Si heterojunctions including ideality factor, barrier height, series resistance and rectification ratio were measured. It was seen that both ideality factor and barrier height values of the heterojunctions increase with the increase substrate temperature. It was attributed to increase in inhomogenity of the thin films. Furthermore, the photoelectrical parameters of CdS/p-Si heterojunctions were studied.en_US
dc.identifier.doi10.1016/j.mssp.2016.11.023
dc.identifier.endpage38en_US
dc.identifier.issn1369-8001
dc.identifier.issn1873-4081
dc.identifier.scopus2-s2.0-85002188900
dc.identifier.scopusqualityQ1
dc.identifier.startpage34en_US
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2016.11.023
dc.identifier.urihttps://hdl.handle.net/11468/15896
dc.identifier.volume58en_US
dc.identifier.wosWOS:000389206800006
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherElsevier Sci Ltden_US
dc.relation.ispartofMaterials Science in Semiconductor Processing
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdsen_US
dc.subjectRf Sputteren_US
dc.subjectSubstrate Temperatureen_US
dc.subjectHeterojunctionen_US
dc.titleThe influence of substrate temperature on RF sputtered CdS thin films and CdS/p-Si heterojunctionsen_US
dc.titleThe influence of substrate temperature on RF sputtered CdS thin films and CdS/p-Si heterojunctions
dc.typeArticleen_US

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