Production of Cu2SnS3 thin films depending on the sulphur flow rate and annealing temperature time
dc.contributor.author | Candan, Ilhan | |
dc.contributor.author | Gezgin, Serap Yigit | |
dc.contributor.author | Baturay, Silan | |
dc.contributor.author | Kilic, Hamdi Sukur | |
dc.date.accessioned | 2024-04-24T16:15:22Z | |
dc.date.available | 2024-04-24T16:15:22Z | |
dc.date.issued | 2023 | |
dc.department | Dicle Üniversitesi | en_US |
dc.description.abstract | Cu2SnS3 thin films have been produced using spin coating method for 30 and 40 sccm sulphur flux rate during three annealing times of 15, 30 and 60 minutes at 550 degrees C. Crystal properties, morphological structure, phase structure, elemental contents and optical properties of Cu2SnS3 thin films have comprehensively been studied by XRD, SEM, Raman, EDX, UV-vis, and photoluminescence analysis, respectively. The crystalline size, dislocation density, microstrain and crystalline number of Cu2SnS3 thin films have been calculated. Cu2SnS3-A2 thin film annealed for 30 minutes has the best crystal structure. Cu2SnS3 thin films contain four different phases depending on sulphur flux rate and the annealing temperature duration. In addition, their band gaps, extinction coefficients and Urbach energies were determined. The refractive index and high frequency dielectric constant of Cu2SnS3 thin film were calculated using Herve and Vandamme, Moss and Ravindra relations and the values found were found to be compatible with one another. The skin depth and optical conductivity of Cu2SnS3 thin films were obtained. While the photon energy increased, their skin depth decreased and the optical conductivity considerably increased. | en_US |
dc.description.sponsorship | Selcuk University Scientific Research Project (BAP) [15201070, 19401140]; Selcuk University, High Technology Research and Application Center (IL-TEK); SULTAN Center for infrastructures; Dicle University Scientific Research Project (BAP) [FEN.18.007] | en_US |
dc.description.sponsorship | Acknowledgements Authors wish to kindly thank the following funding bodies for their support.-Selcuk University Scientific Research Project (BAP) Coordination for the support with the number 15201070 and 19401140 projects.-Selcuk University, High Technology Research and Application Center (IL-TEK) and SULTAN Center for infrastructures.-Dicle University Scientific Research Project (BAP) Coordination for the support with the number FEN.18.007 project. | en_US |
dc.identifier.doi | 10.1016/j.jssc.2021.122711 | |
dc.identifier.endpage | 202 | en_US |
dc.identifier.issn | 1454-4164 | |
dc.identifier.issn | 1841-7132 | |
dc.identifier.issue | 3-4 | en_US |
dc.identifier.scopus | 2-s2.0-85162874918 | |
dc.identifier.scopusquality | Q4 | |
dc.identifier.startpage | 191 | en_US |
dc.identifier.uri | https://doi.org/10.1016/j.jssc.2021.122711 | |
dc.identifier.uri | https://hdl.handle.net/11468/15777 | |
dc.identifier.volume | 25 | en_US |
dc.identifier.wos | WOS:001031942700013 | |
dc.identifier.wosquality | N/A | |
dc.indekslendigikaynak | Web of Science | |
dc.indekslendigikaynak | Scopus | |
dc.language.iso | en | en_US |
dc.publisher | Natl Inst Optoelectronics | en_US |
dc.relation.ispartof | Journal of Optoelectronics and Advanced Materials | |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Cu2sns3 | en_US |
dc.subject | Cts Thin Film | en_US |
dc.subject | Crystalline Size | en_US |
dc.subject | Refractive Index | en_US |
dc.subject | Skin Depth | en_US |
dc.title | Production of Cu2SnS3 thin films depending on the sulphur flow rate and annealing temperature time | en_US |
dc.title | Production of Cu2SnS3 thin films depending on the sulphur flow rate and annealing temperature time | |
dc.type | Article | en_US |