The Annealing Effects of ZnO Thin Films on Characteristic Parameters of Au/ZnO Schottky Contacts on n-Si

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dc.contributor.authorAkkilic, K.
dc.contributor.authorOcak, Y. S.
dc.contributor.authorKilicoglu, T.
dc.contributor.authorToprak, A.
dc.date.accessioned2024-04-24T17:38:14Z
dc.date.available2024-04-24T17:38:14Z
dc.date.issued2012
dc.departmentDicle Üniversitesien_US
dc.description.abstract200 nm ZnO thin films have been grown on n type Silicon substrates by DC sputtering technique. One of the thin films has been annealed at 300 degrees C for 45 minutes. The Au front contacts on ZnO thin films have been formed by evaporation of Au metal by means of shadow mask. It has been seen that the rectification ratio of Au/ZnO device obtained using annealed ZnO thin film is higher than the one obtained using unannealed ZnO thin film. The characteristic parameters of Au/ZnO junctions such as ideality factor, barrier height and series resistance obtained by current-voltage (I-V) measurements of the structures at room temperature and in dark have been compared with each others.en_US
dc.description.sponsorshipDicle University Diyarbakir - Turkey [10-ZEF-165]en_US
dc.description.sponsorshipThis work was funded by BAP project with Grand No 10-ZEF-165 at Dicle University Diyarbakir - Turkey.en_US
dc.identifier.issn2077-6772
dc.identifier.issn2306-4277
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-84865174976
dc.identifier.scopusqualityQ3
dc.identifier.urihttps://hdl.handle.net/11468/21376
dc.identifier.volume4en_US
dc.identifier.wosWOS:000217028800012
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherSumy State Univ, Dept Marketing & Miaen_US
dc.relation.ispartofJournal of Nano- and Electronic Physics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectZnoen_US
dc.subjectSchottky Contacten_US
dc.subjectDc Sputteringen_US
dc.subjectElectrical Propertiesen_US
dc.titleThe Annealing Effects of ZnO Thin Films on Characteristic Parameters of Au/ZnO Schottky Contacts on n-Sien_US
dc.titleThe Annealing Effects of ZnO Thin Films on Characteristic Parameters of Au/ZnO Schottky Contacts on n-Si
dc.typeArticleen_US

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