Browsing by Subject "X-ray analysis"
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The nanostructure based SnS chalcogenide semiconductor: A detailed investigation of physical and electrical properties
(Budapest University of Technology and Economics, 2024)In this research, we fabricate SnS films using a low-cost spray pyrolysis technique. Several parameters such as grain size, textural coefficient, Sn concentration, root mean square (RMS), optical band gap, Urbach and ...